发明名称 SWITCHING ELEMENT FOR INSPECTING CHARACTERISTIC AND CHARACTERISTIC INSPECTING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a switching element capable of eliminating a restriction of its arrangement position on a board for liquid crystal display, and preventing a damage caused by an electrostatic occurring at the time of manufacturing and handling to accurately inspect its characteristic. SOLUTION: Electrode terminals, a source terminal 11, a gate terminal 12, and a drain terminal 13 are respectively connected to a source S, a gate G, and a drain D of a thin film transistor 10 for inspecting characteristics. The electrode terminals are connected to a common-electric-potential terminal 20 through a common-electric-potential wirings 50 for the common electric potential of the repspective electrode terminals. When the characteristics are checked, the common-electric-potential wirings 50 are melted by applying voltages between the electrode terminals and the common-electric-potential terminal 20. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006339409(A) 申请公布日期 2006.12.14
申请号 JP20050162375 申请日期 2005.06.02
申请人 MITSUBISHI ELECTRIC CORP 发明人 ENDO ATSUSHI;NAKAHATA TAKUMI
分类号 H01L21/822;G02F1/1345;G02F1/1365;G02F1/1368;H01L21/66;H01L27/04;H01L29/786 主分类号 H01L21/822
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