发明名称 HEAT TREATMENT APPARATUS AND HEAT TREATMENT METHOD
摘要 PROBLEM TO BE SOLVED: To enable maintain soaking property of a substrate by maintaining soaking property of a guard ring. SOLUTION: A heat treatment apparatus is provided with a heating container 10 for housing a wafer W; a lamp unit 30 provided outside the heating container 10 and heating the wafer W to be housed in the heating container 10; and a susceptor 22 provided in the heating container 10 and holding the wafer W to be housed in the heating container 10. The heat treatment apparatus is further provided with a ring-like guard ring 25 held in the susceptor 22 and supporting the peripheral edge of the wafer W; and a guard ring 26 held in the susceptor 22, configured of the same material as that of the guard ring 25 on the external periphery of the guard ring 25, and arranged like a ring closely to the guard ring 25. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006339187(A) 申请公布日期 2006.12.14
申请号 JP20050158467 申请日期 2005.05.31
申请人 KOKUSAI ELECTRIC SEMICONDUCTOR SERVICE INC 发明人 FUJII SATOSHI;ISHIZU HIDEO;ISHIHARA SHOJI
分类号 H01L21/26;H01L21/683 主分类号 H01L21/26
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