发明名称 METHOD FOR DETECTING FOREIGN MATTER AND APPARATUS FOR OBSERVING EYEBALL
摘要 <P>PROBLEM TO BE SOLVED: To solve a problem that the eyelashes located in front of the eyeball are difficult to detect because of blurring while observing the eyeball. <P>SOLUTION: An apparatus is provided which comprises an imaging means 101 for imaging the eyeball to acquire a first image 102 and a second image 103, a focusing means 104 for moving the imaging means 101 in the focal axis direction in order to focus the imaging means on the iris region, a foreign matter detection means 105 for detecting a foreign matter by calculating difference data which show the differences in relative positions of the iris and pupil regions with respect to the eyelashes located in front of the eyeball between the first and second images 102 and 103, and an observation means 112 for carrying out a desired observation of the first and second images when the foreign matter detection means 105 does not detect a foreign matter. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006333902(A) 申请公布日期 2006.12.14
申请号 JP20050158726 申请日期 2005.05.31
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SUZUKI TAKUYA
分类号 A61B3/14 主分类号 A61B3/14
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