发明名称 |
Method for analyzing organic light-emitting device |
摘要 |
Provided is a method for analyzing the performance of an OLED through activation in-situ. The method includes placing the OLED in an in-situ chamber, driving the OLED, and analyzing a dark spot and/or thermal degradation of the OLED, such that performance of the OLED can be analyzed while driving the OLED in-situ, separated from the external environment.
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申请公布号 |
US7148719(B2) |
申请公布日期 |
2006.12.12 |
申请号 |
US20050090140 |
申请日期 |
2005.03.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE JOU-HAHN;SHIN HYUN-JUN;LIM JONG-SUN;SONG HA-JIN |
分类号 |
G01R31/00;G01R31/26;H05B33/00;H05B33/10 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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