发明名称 Method for analyzing organic light-emitting device
摘要 Provided is a method for analyzing the performance of an OLED through activation in-situ. The method includes placing the OLED in an in-situ chamber, driving the OLED, and analyzing a dark spot and/or thermal degradation of the OLED, such that performance of the OLED can be analyzed while driving the OLED in-situ, separated from the external environment.
申请公布号 US7148719(B2) 申请公布日期 2006.12.12
申请号 US20050090140 申请日期 2005.03.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JOU-HAHN;SHIN HYUN-JUN;LIM JONG-SUN;SONG HA-JIN
分类号 G01R31/00;G01R31/26;H05B33/00;H05B33/10 主分类号 G01R31/00
代理机构 代理人
主权项
地址