发明名称 IMPROVED IMMERSION LITHOGRAPHY SYSTEM WITH WAFER SEALING MECHANISMS
摘要 <p>An improved immersion lithographic system is provided to prevent the leakage of an immersion fluid by covering a wafer edge portion using a wafer sealing mechanism with a sealing rod. An immersion lithographic system includes fluid storing members and a sealing rod. The fluid storing members supply an immersion fluid(308) onto a wafer in order to performing an immersion lithographic process. The sealing rod(318) is used for covering an edge portion of the wafer. The sealing rod is capable of preventing the leakage of the immersion fluid under the immersion lithographic process. The immersion lithographic system further includes a wafer stage for holding the wafer.</p>
申请公布号 KR100659451(B1) 申请公布日期 2006.12.12
申请号 KR20050110846 申请日期 2005.11.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN BURN JENG;GAU TSAI SHENG;CHEN CHUN KUANG;LIU RU GUN;YU SHING SHEN;SHIH JEN CHIEH
分类号 H01L21/027 主分类号 H01L21/027
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