发明名称 Positive-working chemical-amplification photoresist composition
摘要 Disclosed is a positive-working chemical-amplification photoresist composition used in the patterning works in the manufacture of semiconductor devices, with which quite satisfactory patterning of a photoresist layer can be accomplished even on a substrate surface provided with an undercoating film of silicon nitride, phosphosilicate glass, borosilicate glass and the like in contrast to the prior art using a conventional photoresist composition with which satisfactory patterning can hardly be accomplished on such an undercoating film. The photoresist composition comprises, besides a film-forming resin capable of being imparted with increased solubility in an alkaline solution by interacting with an acid and a radiation-sensitive acid-generating compound, a phosphorus-containing oxo acid such as phosphoric acid and phosphonic acid or an ester thereof.
申请公布号 US7147984(B2) 申请公布日期 2006.12.12
申请号 US20040810902 申请日期 2004.03.29
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 YUKAWA HIROTO;OOMORI KATSUMI;UCHIDA RYUSUKE;SAWAYANAGI YUKIHIRO
分类号 G03C1/73;G03F7/039;G03F7/004;G03F7/09;H01L21/027 主分类号 G03C1/73
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