发明名称 |
Detection with evanescent wave probe |
摘要 |
Methods and systems for spatially resolved spin resonance detection in a sample of material are disclosed. Also disclosed are methods and systems for spatially resolved impedance measurements in a sample of material. The disclosed methods and samples can be used in screening of plurality of biological, chemical and material samples.
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申请公布号 |
US7148683(B2) |
申请公布日期 |
2006.12.12 |
申请号 |
US20040833186 |
申请日期 |
2004.04.28 |
申请人 |
INTEMATIX CORPORATION |
发明人 |
XIANG XIAO DONG;YANG HAITAO;WANG GANG |
分类号 |
G01V3/00;G01N24/00;G01N24/10 |
主分类号 |
G01V3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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