发明名称 POLISHING PAD COMPRISING HYDROPHOBIC REGION AND ENDPOINT DETECTION PORT
摘要 The invention provides a chemical-mechanical polishing pad comprising a polishing layer (10) comprising a hydrophobic region (30), a hydrophilic region (40), and an endpoint detection port (20). The hydrophobic region is substantially adjacent to the endpoint detection port (80). The hydrophobic region (30) comprises a polymeric material having a surface energy of 34 mN/rn or less and a polymeric material having a surface energy of more than 34 mN/m. The invention further provides a method of polishing a substrate comprising the use of the polishing pad.
申请公布号 KR20060127219(A) 申请公布日期 2006.12.11
申请号 KR20067019552 申请日期 2005.03.14
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 PRASAD ABANESHWAR
分类号 B24B37/04;B24D13/14;H01L21/304 主分类号 B24B37/04
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