发明名称 |
POLISHING PAD COMPRISING HYDROPHOBIC REGION AND ENDPOINT DETECTION PORT |
摘要 |
The invention provides a chemical-mechanical polishing pad comprising a polishing layer (10) comprising a hydrophobic region (30), a hydrophilic region (40), and an endpoint detection port (20). The hydrophobic region is substantially adjacent to the endpoint detection port (80). The hydrophobic region (30) comprises a polymeric material having a surface energy of 34 mN/rn or less and a polymeric material having a surface energy of more than 34 mN/m. The invention further provides a method of polishing a substrate comprising the use of the polishing pad.
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申请公布号 |
KR20060127219(A) |
申请公布日期 |
2006.12.11 |
申请号 |
KR20067019552 |
申请日期 |
2005.03.14 |
申请人 |
CABOT MICROELECTRONICS CORPORATION |
发明人 |
PRASAD ABANESHWAR |
分类号 |
B24B37/04;B24D13/14;H01L21/304 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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