发明名称 COLD IMPACT TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a cold impact test device capable of minimizing a period required for defrosting operation in a cold impact test. SOLUTION: The cold impact test device 1 has a high-temperature test tub 2 and low-temperature test tub 3, and a rack 4 carrying a sample W can move between the both. In the cold impact test device 1, a moisture absorbing means 25 is attached to the rack 4. In the moisture absorbing means 25, a storing member 28 in which a moisture absorbent 27 such as silica gel and molecular sheave is filled is disposed in a basket-like member 26 attached to the rack 4. The moisture absorbing means 25 can prevent occurrence of dew condensation or frost in the low-temperature test tub 3 by absorbing moisture existing in air. The moisture absorbing means 25 discharges moisture absorbed by the air circulating in the high-temperature test tub 2. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006329827(A) 申请公布日期 2006.12.07
申请号 JP20050154218 申请日期 2005.05.26
申请人 ESPEC CORP 发明人 FUJITA YOSHIHIRO
分类号 G01N3/60 主分类号 G01N3/60
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