发明名称 Systems and methods of process control
摘要 A system of process control. A measurement database stores work-in-process (WIP) measurement data. A monitor database stores tool monitor data. A design of experiment (DOE) database stores DOE data determined by a method of design of experiment, comprising tool operation data and WIP measurement data. A processor determines a compensation value according to preset process target data and the WIP measurement data, and determines tool adjustment data according to the compensation value, the tool monitor data, and the formula pertaining to processing factors.
申请公布号 US2006276922(A1) 申请公布日期 2006.12.07
申请号 US20060402804 申请日期 2006.04.13
申请人 POWERCHIP SEMICONDUCTOR CORP. 发明人 HSU CHIA-CHENG;CHEN CHIEN-CHUNG;LIN MING-CHANG;HSIAO SHIH-TSUNG
分类号 G06F19/00 主分类号 G06F19/00
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