发明名称 AN APPARATUS AND METHOD FOR DEPOSITING THIN FILM ON WAFER
摘要 An apparatus and a method for depositing a thin film on a wafer are provided to deposit the thin film without additional operations by a CVD(Chemical Vapor Deposition) method or an ALD(Atomic Layer Deposition) method. A wafer is loaded into a reaction receptacle(100). A source supply line(212) is connected to a source supply unit(210) to supply a source to the reaction receptacle. A first inert gas supply line(222) is used for supplying an inert gas to the source supply line. A reaction gas supply line(232) is used for connecting the reaction receptacle with a reaction gas supply unit(230). An exhaust line(300) is used for exhausting a gas within the reaction receptacle. A second inert gas supply line(242) is used for supplying the inert gas to the reaction gas supply line. A first bypass line(252) is used for connecting the source supply line with the exhaust line. A first and a second switching valves(V30,V31) are installed at the source supply line and the first bypass line, respectively. A second bypass line(262) is used for connecting the reaction gas supply line with the exhaust line. A third and fourth switching valves(V32,V33) are installed at the reaction gas supply line and the second bypass line, respectively.
申请公布号 KR100657168(B1) 申请公布日期 2006.12.07
申请号 KR20050097523 申请日期 2005.10.17
申请人 INTEGRATED PROCESS SYSTEMS LTD. 发明人 KIM, WOO HYUN;LEE, JAE SAN;SHIN, DONG WON
分类号 H01L21/205 主分类号 H01L21/205
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