| 摘要 |
<P>PROBLEM TO BE SOLVED: To make efficient a burn-in test in a semiconductor integrated circuit provided with a plurality of scan chains. <P>SOLUTION: The semiconductor integrated circuit includes a plurality of the scan chains composed by connecting scan cells in series, and a selecting circuit capable of connecting the scan cells contained in different scan chains. As a test for the semiconductor integrated circuit of this configuration, (1) a scan signal is input into each of the scan chains, a first scan test for monitoring the output of each of the scan chains is executed; on the occasion of the burn-in test, (2-1) in such a state that the scan chains are connected, a second scan test for monitoring the output produced when the scan signal is input, and (2-2) a test by a logical BIST are executed. <P>COPYRIGHT: (C)2007,JPO&INPIT |
