发明名称 REFERENCE INDEX PLATE, METHOD FOR ADJUSTING REFERENCE INDEX PLATE, EXPOSING DEVICE AND METHOD FOR MANUFACTURING MICRO DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a reference index plate with which cost increase and lowering of a yield are suppressed, and which is used for a large sized exposing device. <P>SOLUTION: The reference index plate 29 is used for the exposing device which exposes a mask pattern on a photosensitive substrate via a projection optical system and is made to be a reference of the pattern to be projected or an image projected via the projection optical system, and is equipped with a base plate 32, and a plurality of reference plates 32a-32e which are attached on the base plate 32 and which have reference marks 34a-34l formed thereon. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006330534(A) 申请公布日期 2006.12.07
申请号 JP20050156617 申请日期 2005.05.30
申请人 NIKON CORP 发明人 KUBOTA YASUHITO;NAGAYAMA SAYAKA
分类号 G03F7/20;G01B11/00 主分类号 G03F7/20
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