发明名称 System for measuring FET characteristics
摘要 An FET-characteristic measuring system applies a pulse output from a pulse generator to the gate of an FET in order to measure drain current flowing through the FET. The pulse has a voltage based on a set voltage. The measuring system includes a divider for dividing the pulse output from the pulse generator into a first pulse applied to the gate of the FET and a second pulse for voltage measurement; voltage measuring means for measuring a voltage of the second pulse; and set-voltage adjusting means for determining, based on the voltage of the second pulse, a target set voltage for the pulse generator to apply a pulse having a desired gate application voltage to the FET and for adjusting the set voltage to the target set voltage so that a voltage of the first pulse is equal to the desired gate application voltage.
申请公布号 US2006273807(A1) 申请公布日期 2006.12.07
申请号 US20060412644 申请日期 2006.04.27
申请人 AGILENT TECHNOLOGIES, INC. 发明人 OKAWA YASUSHI
分类号 G01R27/08 主分类号 G01R27/08
代理机构 代理人
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