发明名称 SEMICONDUCTOR MEMORY DEVICE AND DATA WRITE AND READ METHOD THEREOF
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device and a data write and read method thereof. <P>SOLUTION: The device is constituted of a clock signal generating circuit to which an external clock signal is input and which generates first and second signals phase-frequency-synchronizing with the external clock signal in a normal operation and generates the first clock signal being the same as the above and the second clock signal having a high frequency while having the same phase in a test operation, a write-in circuit parallel-converting serial data of the first prescribed bits input with the first data rate in the normal and test write-in operation and outputting it to a memory cell array, and a read-out circuit serial-converting parallel data of the prescribed bits output from the memory cell array responding to the first clock signal in the normal and test read-out operation in response to the second clock signal in the normal read-out operation and outputting it with the first data rate, and serial-converting the data in response to the second clock signal in the test read-out operation and outputting it with the second rate. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2006331631(A) 申请公布日期 2006.12.07
申请号 JP20060144324 申请日期 2006.05.24
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 JANG SEONG-JIN
分类号 G11C29/12;G01R31/28;G11C11/401;G11C11/407 主分类号 G11C29/12
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