发明名称 DIFFERENTIAL MEASURING PROBE
摘要 PROBLEM TO BE SOLVED: To achieve a wide zone by reducing the inductance of a closed circuit on ground. SOLUTION: A ground clip system 12 which electrically connects two differential probe tips 18 and 20 of the differential measuring probe 10 and each of external shield conductors 14 and 16 with each other. In one embodiment, the two probing tips 18 and 20 independently move in coaxial direction in a state that the ground clip system 12 is maintained to each of the external shield conductors 14 and 16 of the two probing tips 18 and 20. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006329993(A) 申请公布日期 2006.12.07
申请号 JP20060147137 申请日期 2006.05.26
申请人 TEKTRONIX INC 发明人 YANG KEI-WEAN C;NIGHTINGALE MARK W;CHASTAIN PAUL G
分类号 G01R1/06;G01R1/067 主分类号 G01R1/06
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