| 摘要 |
PROBLEM TO BE SOLVED: To improve the operability of an interface plate having a plurality of kinds of connector housings. SOLUTION: A semiconductor testing apparatus includes a test head body having a signal module which processes a test signal, a plurality of connecting cables connected with the signal module electrically and having a connector pin at an edge, a plurality of kinds of connector housings for holding a plurality of the connector pins, the interface plate having a plurality of connector blocks attached and detachably mounted in the plate body in the state that the plate body arranged on one surface of the test head body and any kinds of a plurality of kinds of the connector housings are held, and a performance board for electrically connecting the plurality of the connector pins to an electronic device by holding detachably the electronic device and attaching in the interface plate. COPYRIGHT: (C)2007,JPO&INPIT
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