发明名称 Gate contact and runners for high density trench MOSFET
摘要 A trenched metal oxide semiconductor field effect transistor (MOSFET) cell that includes a trenched gate surrounded by a source region encompassed in a body region above a drain region disposed on a bottom surface of a substrate. The MOSFET cell further includes a buried trench-poly gate runner electrically contacting to a trench gate of the trenched MOSFET. The buried trench-poly gate runner for functioning as a gate runner to increase gate transmission area and a contact area to a gate contact metal for reducing a gate resistance.
申请公布号 US2006273390(A1) 申请公布日期 2006.12.07
申请号 US20050182248 申请日期 2005.07.14
申请人 M-MOS SDN. BHD. 发明人 HSHIEH FWU-IUAN;PRATT BRIAN
分类号 H01L29/76 主分类号 H01L29/76
代理机构 代理人
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