发明名称 Polymer for immersion lithography, photoresist composition containing the same, method of manufacturing a semiconductor device, and semiconductor device
摘要 A polymer for immersion lithography comprising a repeating unit represented by Formula 1 and a photoresist composition containing the same. A photoresist film formed by the photoresist composition of the invention is highly resistant to dissolution, a photoacid generator in an aqueous solution for immersion lithography, thereby preventing contamination of an exposure lens and deformation of the photoresist pattern by exposure.
申请公布号 US2006275695(A1) 申请公布日期 2006.12.07
申请号 US20050304052 申请日期 2005.12.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG JAE C.;BOK CHEOL K.;LIM CHANG M.;MOON SEUNG C.
分类号 G03C1/00 主分类号 G03C1/00
代理机构 代理人
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