发明名称 Halbleiter-Package, das ein Neuverteilungsmuster enthält, und Verfahren zu dessen Herstellung
摘要 A semiconductor device package has substrate (21); first and second chip pads spaced apart over substrate surface; insulating layer over substrate surface and having stepped upper surface; conductive reference potential line electrically connected to first chip pad; conductive signal line electrically connected to second chip pad; and first and second external terminals. The semiconductor device package comprises substrate; first and second chip pads spaced apart over the substrate surface; insulating layer over the substrate surface, and comprising a stepped upper surface defined by a lower surface portion, and an upper surface portion, in which a thickness of the insulating layer at the lower surface portion is less than a thickness of the insulating layer at the upper support surface portion; conductive reference potential line electrically connected to the first chip pad and substantially located on the lower surface portion of the insulating layer; conductive signal line electrically connected to the second chip pad and substantially located on the upper surface portion; and first and second external terminals electrically connected to the conductive reference potential line and the conductive signal line, respectively. An independent claim is also included for a method of manufacturing semiconductor device package comprising forming insulating layer over the surface of substrate, in which first and second chip pads are spaced apart over the surface; contouring an upper surface of the insulating layer to obtain stepped upper surface defined by lower and upper surface portions; forming conductive reference potential line on the lower surface portion of the insulating layer which is electrically connected to the first chip pad; forming conductive signal line on the upper surface portion which is electrically connected to the second chip pad; and forming first and second external terminals which are electrically connected to the conductive reference potential line and the conductive signal line, respectively.
申请公布号 DE102005026229(B4) 申请公布日期 2006.12.07
申请号 DE20051026229 申请日期 2005.06.07
申请人 SAMSUNG ELECTRONICS CO. LTD. 发明人 BAEK, SEUNG-DUK;JANG, DONG-HYEON;LEE, JONG-JOO
分类号 H01L23/50;H01L23/52;H01L21/3205;H01L21/60;H01L21/768;H01L23/12;H01L23/31;H01L23/485;H01L23/498;H01L23/522 主分类号 H01L23/50
代理机构 代理人
主权项
地址