发明名称 SEMICONDUCTOR MEMORY DEVICE, SEMICONDUCTOR DEVICE, AND METHOD FOR PRODUCTION THEREOF
摘要 Disclosed are a semiconductor memory device, a semiconductor device, and a method for production thereof. The semiconductor memory device and semiconductor device do not need for a distance for alignment of lithography to make the contact hole with lithography to form the gate electrode. Hence the resulting devices have a reduced area for the cell array. The semiconductor memory device is composed of a substrate having trenches formed side by side, a plate electrode which is formed to a prescribed depth from the surface of the inner wall of the trench, a capacitor insulating film which covers the surface of the inner wall of the trench, a memory node electrode MN which fills the trench, with the capacitor insulating film interposed between them, and a memory node contact plug which is buried in a contact hole which is so made as to reach the memory node electrode from the surface of the semiconductor layer. A metallized region is integrally formed to connect at least part of the surface of the semiconductor layer and at least part of the surface of the contact plug to each other.
申请公布号 US2006275982(A1) 申请公布日期 2006.12.07
申请号 US20060464711 申请日期 2006.08.15
申请人 FUKUZAKI YUZO;TAKAHASHI HIROSHI 发明人 FUKUZAKI YUZO;TAKAHASHI HIROSHI
分类号 H01L21/8242;H01L27/108;H01L21/20;H01L21/8234;H01L21/8244;H01L21/84;H01L27/12;H01L29/76;H01L31/119 主分类号 H01L21/8242
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