发明名称 Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
摘要 A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel. The probe pin is mounted in the first barrel so as to be movable forward and backward. The first spring is mounted in the cavity for elastically biasing the probe pin towards the opening. The damper is mounted to the second end of the first barrel, and elastically supports the first barrel.
申请公布号 US2006273812(A1) 申请公布日期 2006.12.07
申请号 US20060504360 申请日期 2006.08.14
申请人 发明人 GOTO AKIFUMI
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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