发明名称 INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD THEREOF
摘要 An IC device and a manufacturing method thereof are provided to acquire a thinner device structure than a conventional device structure by thinning or removing a substrate. A first layer is formed on one surface of a substrate(100). The hardness of the first layer is higher than that of the substrate. A predetermined element(105) is formed on the first layer. A grinding process or a polishing process is performed on the other surface of the substrate, so that the substrate is remarkably thinned or removed from the resultant structure. The predetermined element includes a TFT.
申请公布号 KR20060126367(A) 申请公布日期 2006.12.07
申请号 KR20060048898 申请日期 2006.05.30
申请人 SEMICONDUCTOR ENERGY LABORATORY K.K. 发明人 DAIRIKI KOJI;KUSUMOTO NAOTO;TSURUME TAKUYA
分类号 H01L27/12 主分类号 H01L27/12
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