发明名称 |
APPARATUS FOR EXPOSING WAFER |
摘要 |
<p>An apparatus for exposing a wafer is provided to transfer certain light on a wafer through a changed optimal focusing position by moving a wafer stage to the optimal focusing position. A light source(10) emits a light exposing a wafer(15). A reticle(20) is mounted on a lower end of the light source. A certain pattern to be transferred to the wafer is formed on the reticle. An optical system(30) is mounted on a lower end of the reticle. The optical system measures an optimal focusing distance to irradiate light so that the light is irradiated on a certain position as certain amount in order to transfer the pattern formed on the reticle to the wafer. A wafer stage(40) supports the wafer and moves the wafer to the optimum focusing position measured in the optical system to a vertical direction. A driving unit(50) drives the wafer stage.</p> |
申请公布号 |
KR20060126214(A) |
申请公布日期 |
2006.12.07 |
申请号 |
KR20050047946 |
申请日期 |
2005.06.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KANG, KYUNG HOON |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|