发明名称 APPARATUS FOR EXPOSING WAFER
摘要 <p>An apparatus for exposing a wafer is provided to transfer certain light on a wafer through a changed optimal focusing position by moving a wafer stage to the optimal focusing position. A light source(10) emits a light exposing a wafer(15). A reticle(20) is mounted on a lower end of the light source. A certain pattern to be transferred to the wafer is formed on the reticle. An optical system(30) is mounted on a lower end of the reticle. The optical system measures an optimal focusing distance to irradiate light so that the light is irradiated on a certain position as certain amount in order to transfer the pattern formed on the reticle to the wafer. A wafer stage(40) supports the wafer and moves the wafer to the optimum focusing position measured in the optical system to a vertical direction. A driving unit(50) drives the wafer stage.</p>
申请公布号 KR20060126214(A) 申请公布日期 2006.12.07
申请号 KR20050047946 申请日期 2005.06.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, KYUNG HOON
分类号 H01L21/027 主分类号 H01L21/027
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