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发明名称
Tragbare Prüfeinrichtung zum Prüfen von mit hohen Spannungen und/oder hohen Strömen zu betreibenden Prüflingen und Prüfsystem
摘要
申请公布号
DE10048962(B4)
申请公布日期
2006.12.07
申请号
DE20001048962
申请日期
2000.10.04
申请人
OMICRON ELECTRONICS GMBH
发明人
HENSLER, THOMAS;KAUFMANN, REINHARD;KLAPPER, ULRICH;KRUEGER, MICHAEL;SCHREINER, ZELJKO
分类号
G01R31/00;G01R31/06;G01R31/34
主分类号
G01R31/00
代理机构
代理人
主权项
地址
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