发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To solve the matter of an photodetector split into four that the process for forming an isolation structure is intricate. <P>SOLUTION: On a P-sub layer 80 becoming the common anode of a PIN photodiode (PIN-PD) in each section, an epitaxial layer 82 of high specific resistance becoming the i-layer of the PIN-PD is grown. On the boundary of a section 62, an isolation region 64 of p<SP>+</SP>region is formed by ion implantation from the surface of a substrate. When the PIN-PD is made to function by reverse biasing a cathode region 66 formed in each region and the P-sub layer 80, the isolation region 64 is brought to ground potential together with the P-sub layer 80 and becomes the anode. Consequently, a potential barrier against electrons is formed on the epitaxial layer 82 between the isolation region 64 and the P-sub layer 80. Consequently, electrons generated by absorbing light in each region are prevented from migrating to an adjacent section thus achieving isolation. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006332104(A) 申请公布日期 2006.12.07
申请号 JP20050149472 申请日期 2005.05.23
申请人 SANYO ELECTRIC CO LTD 发明人 HASEGAWA AKIHIRO
分类号 H01L31/10;H01L21/761 主分类号 H01L31/10
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