发明名称 |
IONIZATION SUBSTRATE FOR MASS ANALYSIS AND MASS ANALYZER |
摘要 |
PROBLEM TO BE SOLVED: To provide a sample substrate for laser desorption ionizing mass analysis and soft LDI-MS measurement which enables the accurate measurement without forming an obstruction peak at the time of irradiation with a laser beam, and the uniform coating of a sample at the time of production of the sample, and a measuring instrument using it. SOLUTION: As an ionizing medium for absorbing a laser beam used in laser desorption ionizing mass analysis, specified ionization element having a dot structure is used. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2006329977(A) |
申请公布日期 |
2006.12.07 |
申请号 |
JP20060116525 |
申请日期 |
2006.04.20 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
SATO HIROAKI;YAMAMOTO ATSUSHI;KIYONO TERUYUKI;TORIMURA MASAMOTO;TAO HIROAKI |
分类号 |
G01N27/62;G01N27/64;H01J49/04;H01J49/10 |
主分类号 |
G01N27/62 |
代理机构 |
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