摘要 |
<p>A metal that can be dissolved in aqua regia or a metal alloy containing a metal that can be dissolved in aqua regia can be effectively removed from a substrate, and particularly a silicon wafer substrate by a method of application of a composition having a HC1(concentrated)/hydrogen peroxide(concentrated) volume ratio of about 1:1 to about 4:1 that is substantially free of added water. In another embodiment, a metal that can be dissolved in aqua regia or a metal alloy containing a metal that can be dissolved in aqua regia is removed from a substrate by a composition comprising HC1(concentrated)/hydrogen peroxide(concentrated)/water in a volume ratio of from about 2:0.5:4 to about 4:2:4. The composition, heated to a temperature of about 60° C. to about 100°C, is applied to a substrate having the metal or metal alloy thereon, which is preferably heated to a temperature of from about 50°C to about 100°C. The metal or metal alloy preferably is platinum metal or a metal alloy comprising platinum metal, and the substrate is a silicon wafer substrate.</p> |
申请人 |
FSI INTERNATIONAL, INC.;HANESTAD, RONALD, J.;OLSON, ERIK, D.;FUSSY, MICHAEL |
发明人 |
HANESTAD, RONALD, J.;OLSON, ERIK, D.;FUSSY, MICHAEL |