发明名称 SHAPE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To measure the surface shape of a measuring object with a weak contact force, while changing the contact force. SOLUTION: A measuring probe 32 is supported at an inclinationθ. Since the retreating force of the measuring probe 32 is generated by the inclinationθ, far smaller mgsigθthan a self-weight m is acquired. The measuring probe 32 is energized with a pushing force Fc by an air cylinder 40. Hereby, since the contact force of the measuring probe 32 to a work W comprises a difference (F=Fc-mgsigθ) between the gage head self-weight inclination component mgsigθand the pushing force Fc by the air cylinder 40, the contact force can be weakened by a large amount. In addition, the contact force can be changed by changing the pushing force Fc by the air cylinder 40. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006329795(A) 申请公布日期 2006.12.07
申请号 JP20050153284 申请日期 2005.05.26
申请人 JTEKT CORP 发明人 MATSUMOTO TAKASHI;SHINNO YASUO;OKITA TOSHIYUKI;YAMAMOTO YOSHIJI
分类号 G01B5/20 主分类号 G01B5/20
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