发明名称 DUAL STAGE LITHOGRAPHIC DEVICE AND METHOD OF MANUFACTURING THE DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithographic device having a high throughput and that can transfer patterns with relatively small structures on substrates. <P>SOLUTION: The invention relates to a dual stage lithographic device, in which two substrate stages are constructed to cooperate with each other to perform a joint sweep movement for guiding the lithographic device from a first condition, a condition in which an immersion liquid is confined between a first substrate carried by a first stage of the stages and a final element of the projection system in the device, to a second condition, a condition in which the liquid is confined between a second substrate carried by a second stage of the two stages and the final element, such that during the joint sweep movement, the liquid is confined to be substantially within the described space with respect to the final element. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006332656(A) 申请公布日期 2006.12.07
申请号 JP20060139902 申请日期 2006.05.19
申请人 ASML NETHERLANDS BV 发明人 BRINK MARINUS AART VAN DEN;BENSCHOP JOZEF PETRUS HENRICUS;LOOPSTRA ERIK ROELOF
分类号 H01L21/027 主分类号 H01L21/027
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