发明名称 POLISHING EQUIPMENT AND METHOD OF SEMICONDUCTOR WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide polishing equipment capable of polishing a wafer at a high profile accuracy which has a large diameter processing surface. <P>SOLUTION: The present polishing equipment of semiconductor wafer forms a processing chamber which is arranged extendedly in an aperture of head body and in partition from exterior between it and the head body, comprises a roughly circular membrane holding the semiconductor wafer with an inner circumference lower surface, and prepares an air temperature controlling means for controlling a temperature of air directly pressurizing the membrane with air pressure. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006332520(A) 申请公布日期 2006.12.07
申请号 JP20050157363 申请日期 2005.05.30
申请人 TOSHIBA CERAMICS CO LTD 发明人 KUHARA KATSUMI
分类号 H01L21/304;B24B37/015;B24B37/04;B24B37/30 主分类号 H01L21/304
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