| 摘要 |
PROBLEM TO BE SOLVED: To provide a thermal shock testing device capable of shortening a time required for executing one cycle of thermal cycle, to the minimum, and capable of carrying out a thermal shock test under a stable condition, irrespective of conditions such as a heat capacity of a sample and a quantity of the sample, and a testing method for the thermal shock test. SOLUTION: This thermal shock testing device 1 has a high temperature testing vessel 2 and a low temperature testing vessel 3, and a rack 4 for mounting the sample is movable between the both. The thermal shock testing device 1 stores a difference time between a time until an ambient temperature in a testing environment detected by an environment temperature detecting sensor 9 reaches a prescribed temperature, and a time until a temperature of the sample W itself reaches the prescribed temperature, in a preliminary test. In the thermal shock testing device 1, the sample W is exposed under the testing environment over a prescribed exposure time counted from a time point with the lapse of the difference time, after the detection temperature by the environment temperature detecting sensor 9 reaches the prescribed set temperature, in an objective test. COPYRIGHT: (C)2007,JPO&INPIT
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