发明名称 Automated surface distress measurement system
摘要 The present invention is an apparatus, system and method for determining surface conditions in real time including a real time digital imaging device positioned relative to capture one or more images of a surface and an image processing device that processes the one or more images to identify defects (e.g., cracks) in the surface, wherein the imaging processing device determines the intensity of one or more regions of the one or more images, compares the intensity of one of the one or more regions to the intensity of another of the one or more regions, and designates the region as defective.
申请公布号 US2006276985(A1) 申请公布日期 2006.12.07
申请号 US20060439551 申请日期 2006.05.23
申请人 BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM 发明人 XU BUGAO;HUANG YAXIONG
分类号 G01N37/00 主分类号 G01N37/00
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