发明名称 METHOD OF SEGMENTING A WAFER
摘要 First, a device wafer having a substrate layer and a device layer is provided. Then, a first mask pattern is utilized to remove the device layer uncovered by the first mask pattern. Subsequently, a medium layer is formed on the surface of the device wafer, and the medium layer is then bonded to a carrier wafer. Thereafter, a second mask pattern is utilized to remove the substrate layer uncovered by the second mask pattern. Finally, the medium layer is separated from the carrier wafer, the substrate layer is bonded to an extendable film, and the medium layer is then removed.
申请公布号 US2006276005(A1) 申请公布日期 2006.12.07
申请号 US20050160975 申请日期 2005.07.18
申请人 YANG CHEN-HSIUNG 发明人 YANG CHEN-HSIUNG
分类号 H01L21/78 主分类号 H01L21/78
代理机构 代理人
主权项
地址