发明名称 Charged particle beam extraction system and method
摘要 A charged particle beam extraction system and method capable of ensuring higher safety when extraction of an ion beam is on/off-controlled during irradiation of the ion beam for treatment. The charged particle beam extraction system comprises a charged particle beam generator including a synchrotron, a range modulation wheel (RMW) for forming a Bragg peak width of a charged particle beam extracted from the charged particle beam generator, a gate signal generator for controlling start and stop of extraction of the charged particle beam from the charged particle beam generator in accordance with a rotational angle of the RMW, and an irradiation control/determination section for determining whether the start and stop of extraction of the charged particle beam is controlled at desired timing by the gate signal generator.
申请公布号 US2006273264(A1) 申请公布日期 2006.12.07
申请号 US20050146074 申请日期 2005.06.07
申请人 NAKAYAMA TAKAHIDE;NATORI TAKAYOSHI;YANAGISAWA MASAKI 发明人 NAKAYAMA TAKAHIDE;NATORI TAKAYOSHI;YANAGISAWA MASAKI
分类号 A61N5/10 主分类号 A61N5/10
代理机构 代理人
主权项
地址
您可能感兴趣的专利