发明名称 METHOD FOR FORMING A CONTACT PLUG IN SEMICONDUCTOR DEVICE
摘要 A method for forming a contact plug of a semiconductor device is provided to improve contact failure between a lower conductive layer and an upper conductive layer by forming an etch stop layer on a dielectric exposed to both sides of the lower conductive layer. A semiconductor substrate on which a first dielectric(110) is formed is provided. A conductive layer(112) is formed in the first dielectric so that a part of the conductive layer is projected to an upper portion of the first dielectric. An etch stop layer(114) is deposited along a step of the upper portion of the first dielectric including the conductive layer. A second dielectric(115) is deposited on the etch stop layer. The second dielectric and the etch stop layer are etched to form a contact hole(118) exposing the part of the conductive layer. A contact plug is formed to gap-fill the contact hole.
申请公布号 KR20060126235(A) 申请公布日期 2006.12.07
申请号 KR20050047976 申请日期 2005.06.03
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SUNG KWON;JUNG, TAE WOO
分类号 H01L21/28 主分类号 H01L21/28
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