发明名称 |
METHOD FOR FORMING A CONTACT PLUG IN SEMICONDUCTOR DEVICE |
摘要 |
A method for forming a contact plug of a semiconductor device is provided to improve contact failure between a lower conductive layer and an upper conductive layer by forming an etch stop layer on a dielectric exposed to both sides of the lower conductive layer. A semiconductor substrate on which a first dielectric(110) is formed is provided. A conductive layer(112) is formed in the first dielectric so that a part of the conductive layer is projected to an upper portion of the first dielectric. An etch stop layer(114) is deposited along a step of the upper portion of the first dielectric including the conductive layer. A second dielectric(115) is deposited on the etch stop layer. The second dielectric and the etch stop layer are etched to form a contact hole(118) exposing the part of the conductive layer. A contact plug is formed to gap-fill the contact hole.
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申请公布号 |
KR20060126235(A) |
申请公布日期 |
2006.12.07 |
申请号 |
KR20050047976 |
申请日期 |
2005.06.03 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, SUNG KWON;JUNG, TAE WOO |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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