METHOD OF TESTING OPEN SERVICES GATEWAY INITIATIVE SERVICE PLATFORM AND TEST TOOL USING THE METHOD,申请号EP20050726747-传众专利搜索

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发明名称	METHOD OF TESTING OPEN SERVICES GATEWAY INITIATIVE SERVICE PLATFORM AND TEST TOOL USING THE METHOD
摘要
申请公布号	EP1728159(A1)	申请公布日期	2006.12.06
申请号	EP20050726747	申请日期	2005.02.18
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	JEONG, SUNG-WON;YEO, GI-DAE;JANG, YOUNG-SUK;SUNG, SOOK-HEE;LEE, HYUN-DONG
分类号	G06F11/00;G06F11/36;G01N21/00	主分类号	G06F11/00
代理机构		代理人
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