发明名称 |
MATERIAL FOR INNER ELECTRODE OF ELECTRONIC COMPONENT |
摘要 |
A material for an inner electrode of an electronic component is provided to prevent the reduction of capacitance of a chip by preventing the disconnection of inner electrode at a firing temperature over 1000 degrees centigrade. A material for an inner electrode of an electronic component is composed of a Ni-based alloy layer made of one alloy element selected from a group composed of Ni of 70 to 99wt%, Al of 1 to 30wt%, Cr and Co on a dielectric sheet.
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申请公布号 |
KR20060125277(A) |
申请公布日期 |
2006.12.06 |
申请号 |
KR20050047232 |
申请日期 |
2005.06.02 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
LEE, YOUNG WOO;CHO, SEONG WON;CHO, JEONG MIN |
分类号 |
H01G4/008 |
主分类号 |
H01G4/008 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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