| 摘要 |
A semiconductor device is provided to achieve optimum timing margin and to automatically adjust write recovery time without an additional test mode for setting enable timing of a sense amplifier driving signal by automatically setting the enabling timing of the sense amplifier driving signal during an initial operation. In a semiconductor device having an auto calibration function for adjusting write recovery time, a control circuit(200) outputs an enable signal and a first write command and a read command to perform auto calibration by receiving an auto calibration start signal under an auto calibration mode. A sense amplifier driving signal generation part(130) supplies a sense amplifier driving signal to a core part in response to an enable signal from the control circuit. A first global input data generation part(150) supplies first global input data to perform auto calibration to the core part through a global input/output line in response to the first write command. A global data detection part(160) compares the first global input data with global output data output from the core part by the read command, and then provides the comparison result to the control circuit.
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