发明名称 METHOD OF MANUFACTURING FERROELECTRIC LAYER AND METHOD OF MANUFACTURING ELECTRONIC INSTRUMENT
摘要 <p>A method for fabricating a ferroelectric layer is provided to crystallize a ferroelectric layer at a low temperature in forming a semiconductor device, a piezoelectric device and the like by using a ferroelectric layer having excellent orientation. An insulation layer is formed on a base material. A hole is formed in the insulation layer. An electrode layer(10) is formed in the hole. A first ferroelectric layer(22) is formed on the electrode layer by an MOCVD method. A second ferroelectric layer(24) is formed on the first ferroelectric layer by a liquid method.</p>
申请公布号 KR20060125583(A) 申请公布日期 2006.12.06
申请号 KR20060049335 申请日期 2006.06.01
申请人 SEIKO EPSON CORPORATION 发明人 KIJIMA TAKESHI
分类号 H01L27/105;B41J2/045;B41J2/055;B41J2/135;B41J2/14;B41J2/16;H01L21/316;H01L21/8246;H01L41/09;H01L41/18;H01L41/187;H01L41/316;H01L41/317;H01L41/319;H01L41/39 主分类号 H01L27/105
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