发明名称 APPARATUS AND METHOD FOR CONTROLLING COLUMN SELECTING SIGNAL OF SEMICONDUCTOR MEMORY
摘要 An apparatus and a method for controlling a column selecting signal of a semiconductor memory are provided to maximize reliability of a memory operation by preventing an output error of the column selecting signal according to the variation of an external voltage by controlling the column selecting signal according to the external voltage level. A column decoder(10) outputs a first column selecting signal. A delay part delays the first column selecting signal. A logic circuit part outputs a second column selecting signal by controlling the enable period of the first column selecting signal, by calculating the first column selecting signal and the output of the delay part. An output control unit(300) outputs the first column selecting signal or the second column selecting signal in response to the input of a voltage detection signal.
申请公布号 KR100656432(B1) 申请公布日期 2006.12.05
申请号 KR20050107056 申请日期 2005.11.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JEONG WOO
分类号 G11C8/10 主分类号 G11C8/10
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