发明名称 |
SEMICONDUCTOR WAFER AND SEMICONDUCTOR DEVICE FORMED THEREBY |
摘要 |
<p>A semiconductor wafer and a semiconductor device formed thereby are provided to prevent a breakdown of a resist layer due to residual gas by covering a groove with a protective layer. An integrated circuit is formed in an active region(3). A dicing region(4) is formed between adjacent active regions. A seal ring is formed along a periphery of the active area. A first wiring is formed closely to an inner periphery of the seal ring. A protective layer(5) is used for covering the active region. A protective film(7) is formed on the protective layer and is extended to the active region. A second wiring is formed on the protective film and is electrically connected to the integrated circuit. A groove is formed in the protective layer between the seal ring and the first wiring. The groove is covered with the protective film.</p> |
申请公布号 |
KR20060124555(A) |
申请公布日期 |
2006.12.05 |
申请号 |
KR20060027050 |
申请日期 |
2006.03.24 |
申请人 |
OKI ELECTRIC INDUSTRY CO., LTD. |
发明人 |
OHSUMI TAKASHI |
分类号 |
H01L21/60;H01L21/027;H01L21/20 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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