发明名称 SEMICONDUCTOR WAFER AND SEMICONDUCTOR DEVICE FORMED THEREBY
摘要 <p>A semiconductor wafer and a semiconductor device formed thereby are provided to prevent a breakdown of a resist layer due to residual gas by covering a groove with a protective layer. An integrated circuit is formed in an active region(3). A dicing region(4) is formed between adjacent active regions. A seal ring is formed along a periphery of the active area. A first wiring is formed closely to an inner periphery of the seal ring. A protective layer(5) is used for covering the active region. A protective film(7) is formed on the protective layer and is extended to the active region. A second wiring is formed on the protective film and is electrically connected to the integrated circuit. A groove is formed in the protective layer between the seal ring and the first wiring. The groove is covered with the protective film.</p>
申请公布号 KR20060124555(A) 申请公布日期 2006.12.05
申请号 KR20060027050 申请日期 2006.03.24
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 OHSUMI TAKASHI
分类号 H01L21/60;H01L21/027;H01L21/20 主分类号 H01L21/60
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