| 摘要 |
<p>An electron emission device is provided to suppress the generation of sub-beams in an operating state thereof by optimizing relation between a focusing voltage and a focusing electrode structure. An electron emission device includes at least one drive electrode for controlling electrons emitted from an electron emission part(12) formed on a substrate(2). The electron emission device includes openings(14a,16a) for transmitting electron beams, a focusing electrode(16) for focusing electrons, and insulating layers(8,14) positioned between at least one drive electrode and the focusing electrode. The focusing electrode satisfies the following condition 1.0<=[Vf/t]<=6.0 and 0.2<=[Vf/Wh]<=0.4 where Vf(V) is a voltage applied to the focusing electrode, t(‘í) is thickness of the insulating layer, and Wh(‘í) is width of the opening of the focusing electrode.</p> |
