发明名称 Tester for a semiconductor device
摘要 A tester including a first module for testing a digital-to-analog conversion and a second module for testing an analog-to-digital conversion. The tester may include a controller for controlling operation of the first and second modules. The tester does not require a system bus, and modules may be swapped, added to the tester and/or removed from the tester based on application specific requirements.
申请公布号 US7145489(B2) 申请公布日期 2006.12.05
申请号 US20050101412 申请日期 2005.04.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUN BYOUNG-OK
分类号 H03M1/10 主分类号 H03M1/10
代理机构 代理人
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