发明名称 DIAGNOSTIC APPARATUS FOR FOCUSING ELECTRON BEAM IN MICROWAVE AMPLIFIER
摘要 A diagnostic apparatus for focusing an electron beam in a microwave amplifier is provided to minimize an interception current value by adjusting a magnetic field value of a magnet for focusing the electron beam. A diagnostic apparatus includes a cathode for generating an electron beam, an RF input unit for modulating the electron beam, an RF output unit for outputting an amplified electromagnetic wave by converting kinetic energy of the modulated electron beam, a magnet for focusing the electron beam, and a collector for collecting the electron beam. The diagnostic apparatus further includes a film(20) formed with an insulating and flexible material, a plurality of electrode terminals(21-30) disposed on the film, and a plurality of current meters connected with the electrode terminals in order to measure the amount of current.
申请公布号 KR20060124474(A) 申请公布日期 2006.12.05
申请号 KR20050046419 申请日期 2005.05.31
申请人 UHM, HAN SUP;KIM, HYEONG SEOK;LEE, SUNG JOO;SHIN, JUNG WOOK;NA, YOUNG HO;KO, YOUNG SAM 发明人 UHM, HAN SUP;KIM, HYEONG SEOK;NA, YOUNG HO;SHIN, JUNG WOOK;LEE, SUNG JOO;KO, YOUNG SAM
分类号 H01J23/08 主分类号 H01J23/08
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