发明名称 Sealed electron beam source
摘要 A sealed electron beam source ( 12 ) for an imaging tube ( 16 ) is provided. The beam source ( 12 ) includes a source housing ( 50 ) with a source window ( 54 ) having a first voltage potential and a source electrode ( 52 ) having a second voltage potential. The source electrode ( 52 ) generates electrons and emits the electrons through the source window ( 54 ) to a target ( 32 ) that is external to the source housing ( 50 ). A method of supplying and directing electrons on the target ( 32 ) within the imaging tube ( 16 ) is also provided. The method includes forming the source housing ( 50 ) over the source electrode ( 52 ) and sealing the source housing ( 50 ). The electrons are generated and emitted from the source electrode ( 52 ) and directed through the source window ( 54 ) to the target ( 32 ).
申请公布号 US7145988(B2) 申请公布日期 2006.12.05
申请号 US20030707284 申请日期 2003.12.03
申请人 GENERAL ELECTRIC COMPANY 发明人 PRICE J. SCOTT;DUNHAM BRUCE M.
分类号 H01J35/02;A61B6/03;H01J33/02;H01J35/06;H01J35/08;H01J35/10;H01J35/12 主分类号 H01J35/02
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