发明名称 |
Sealed electron beam source |
摘要 |
A sealed electron beam source ( 12 ) for an imaging tube ( 16 ) is provided. The beam source ( 12 ) includes a source housing ( 50 ) with a source window ( 54 ) having a first voltage potential and a source electrode ( 52 ) having a second voltage potential. The source electrode ( 52 ) generates electrons and emits the electrons through the source window ( 54 ) to a target ( 32 ) that is external to the source housing ( 50 ). A method of supplying and directing electrons on the target ( 32 ) within the imaging tube ( 16 ) is also provided. The method includes forming the source housing ( 50 ) over the source electrode ( 52 ) and sealing the source housing ( 50 ). The electrons are generated and emitted from the source electrode ( 52 ) and directed through the source window ( 54 ) to the target ( 32 ). |
申请公布号 |
US7145988(B2) |
申请公布日期 |
2006.12.05 |
申请号 |
US20030707284 |
申请日期 |
2003.12.03 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
PRICE J. SCOTT;DUNHAM BRUCE M. |
分类号 |
H01J35/02;A61B6/03;H01J33/02;H01J35/06;H01J35/08;H01J35/10;H01J35/12 |
主分类号 |
H01J35/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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