发明名称 Process for production of a semiconductor device
摘要 Disclosed herein is a semiconductor device with high reliability which has TFT of adequate structure arranged according to the circuit performance required. The semiconductor has the driving circuit and the pixel portion on the same substrate. It is characterized in that the storage capacitance is formed between the first electrode formed on the same layer as the light blocking film and the second electrode formed from a semiconductor film of the same composition as the drain region, and the first base insulating film is removed at the part of the storage capacitance so that the second base insulating film is used as the dielectric of the storage capacitance. This structure provides a large storage capacitance in a small area. <IMAGE>
申请公布号 KR100652821(B1) 申请公布日期 2006.12.01
申请号 KR20050004450 申请日期 2005.01.18
申请人 发明人
分类号 H01L29/786;G02F1/1362;G02F1/1368;H01L21/77;H01L21/84;H01L27/12;H01L27/13;H01L27/32;H01L29/04 主分类号 H01L29/786
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