发明名称 |
APPARATUS FOR ELIMINATING A PARTICLE FROM A SEMICONDUCTOR SUBSTRATE AND EQUIPMENT FOR PROCESSING A SEMICONDUCTOR SUBSTRATE USING THE SAME |
摘要 |
<p>An apparatus for removing particles and semiconductor substrate processing equipment having the same are provided to prevent physical damage of a semiconductor substrate by using a detecting unit and a cleaner for eliminating the particles. A light emitting unit(111) scans a lower surface of a semiconductor substrate(W) with a ribbon-shaped wide beam. A light receiving unit(112) receives a light reflected or scattered from the lower surface. A detecting unit(130) analyzes the received light to verify existence of particles(P) on the lower surface. A cleaner(140) sucks the verified particles to remove it from the lower surface. The cleaner includes a spray module. The spray module sprays a gas to the lower surface to separate the verified particles from the lower surface.</p> |
申请公布号 |
KR20060122417(A) |
申请公布日期 |
2006.11.30 |
申请号 |
KR20050044875 |
申请日期 |
2005.05.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HAK |
分类号 |
H01L21/027;H01L21/304 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|