发明名称 APPARATUS FOR ELIMINATING A PARTICLE FROM A SEMICONDUCTOR SUBSTRATE AND EQUIPMENT FOR PROCESSING A SEMICONDUCTOR SUBSTRATE USING THE SAME
摘要 <p>An apparatus for removing particles and semiconductor substrate processing equipment having the same are provided to prevent physical damage of a semiconductor substrate by using a detecting unit and a cleaner for eliminating the particles. A light emitting unit(111) scans a lower surface of a semiconductor substrate(W) with a ribbon-shaped wide beam. A light receiving unit(112) receives a light reflected or scattered from the lower surface. A detecting unit(130) analyzes the received light to verify existence of particles(P) on the lower surface. A cleaner(140) sucks the verified particles to remove it from the lower surface. The cleaner includes a spray module. The spray module sprays a gas to the lower surface to separate the verified particles from the lower surface.</p>
申请公布号 KR20060122417(A) 申请公布日期 2006.11.30
申请号 KR20050044875 申请日期 2005.05.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HAK
分类号 H01L21/027;H01L21/304 主分类号 H01L21/027
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