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发明名称
Verfahren und Messanordnung zur elektrischen Ermittlung der Dicke von Halbleitermembranen durch Energieeintrag
摘要
申请公布号
DE102004051113(B4)
申请公布日期
2006.11.30
申请号
DE200410051113
申请日期
2004.10.21
申请人
X-FAB SEMICONDUCTOR FOUNDRIES AG
发明人
HERING, SIEGFRIED;HOELZER, GISBERT
分类号
G01B7/06;G01B15/02
主分类号
G01B7/06
代理机构
代理人
主权项
地址
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