On-chip apparatus and method for determining integrated circuit stress conditions

摘要

A method and apparatus for determining whether an integrated circuit has been subjected to stress conditions during operation. The integrated circuit comprises a test device that is exposed to the same power supply voltage and temperature as other devices in the integrated circuit. Certain expected operating parameters, as a function of the operating life of the integrated circuit, are predetermined. If a measured value of the operating parameter exceeds the expected value then the integrated circuit has been subjected to stress conditions.